Highly Accelerated Life Test (HALT)
In the end, the so-called HALT procedure is nothing more than a greatly accelerated life test with a partial or total failure of the test device, this time even deliberately accepted. A special stress test methodology is used for this purpose, which allows product safety to be implemented as quickly as possible during the development process, since it is already known afterwards exactly where the limits of the current development status lie.
Simplified, the whole thing could also be called artificial aging.
The aim of HALT is to check the possible failure behaviour of the electronic, electrical, mechanical and electro-mechanical components and to expose the power supply units again to extreme thermal, mechanical and, of course, product-specific stress situations until the function is disturbed. This process is more or less interactive, because possible causes of failure can already be identified during the HALT process, named and also eliminated through improvements. In extreme cases, a run can take up to five days.
In this way, weak points are found that would otherwise only be noticed by the customer and user in the course of a longer period of use. Unfortunately, not all manufacturers use such elaborate, time-consuming and therefore cost-intensive tests, which becomes apparent at the latest when the RMA rate of a product rises unnaturally high after a certain period of time.
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